发明名称 FIXING TOOL FOR CONTACT PROBE
摘要 <P>PROBLEM TO BE SOLVED: To provide a fixing tool for a contact probe capable of reducing a contact trace as much as possible when probing. Ž<P>SOLUTION: The fixing tool 10 for the contact probe, which is configured such that one end is attached to a probe guide mechanism and a probe body 2 can be fixed, and which brings the fixed probe body 2 into contact with a probing target P according to the guide by the probe guide mechanism, includes a link mechanism RM which permits a linear or approximately linear movement of the probe body 2 in the reverse direction to an urging direction by the elastic deformation of elastic deformation portions 8a-8d when the probe body 2 is in a contact state and is further urged toward the probing target P by the probe guide mechanism. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010078617(A) 申请公布日期 2010.04.08
申请号 JP20100002889 申请日期 2010.01.08
申请人 HIOKI EE CORP 发明人 TOMOI TADASHI
分类号 G01R1/06;G01R31/28 主分类号 G01R1/06
代理机构 代理人
主权项
地址