发明名称 TERMINAL TEST APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To improve the workability of a simulation test on terminals. Ž<P>SOLUTION: The terminal test apparatus includes a load applicator 5 which moves a probe 3 to be in contact with a test piece 1 fixed at a predetermined position and simulates the contact state of a pair of terminals. The load applicator 5 includes a spring member 13 for adjusting a load applied to the test piece 1 and a support member 7 which is slidably supported in the moving direction of the probe 3 and to which the probe 3 is mounted. The support member 7 has a groove 21 which allows the probe 3 to be attached/detached in the direction perpendicular to the moving direction and attaches or detaches the probe in the direction perpendicular to the moving direction. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010078357(A) 申请公布日期 2010.04.08
申请号 JP20080244349 申请日期 2008.09.24
申请人 YAZAKI CORP 发明人 SHIMADA TOMOHIRO;KISHIHATA YUYA
分类号 G01R1/06;H01R13/24;H01R43/00 主分类号 G01R1/06
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