发明名称 |
SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device wherein breakage of a gate insulating film is suppressed. SOLUTION: The semiconductor device has a contact hole 13 in a position overlapping a gate electrode 8 covering a surface of a silicon pillar 5 for power supply to the gate electrode, and the contact hole 13 has: a gate lift polysilicon 14 filled from a bottom of the contact hole 13 beyond at least a top surface of the gate electrode 8; and a gate contact 15 disposed on the gate lift polysilicon 14. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010080756(A) |
申请公布日期 |
2010.04.08 |
申请号 |
JP20080248721 |
申请日期 |
2008.09.26 |
申请人 |
ELPIDA MEMORY INC |
发明人 |
IKEFUCHI YOSHINORI;OYU SHIZUNORI;TAKAISHI YOSHIHIRO |
分类号 |
H01L29/78;H01L21/28;H01L29/417;H01L29/423;H01L29/49 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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