发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device wherein breakage of a gate insulating film is suppressed. SOLUTION: The semiconductor device has a contact hole 13 in a position overlapping a gate electrode 8 covering a surface of a silicon pillar 5 for power supply to the gate electrode, and the contact hole 13 has: a gate lift polysilicon 14 filled from a bottom of the contact hole 13 beyond at least a top surface of the gate electrode 8; and a gate contact 15 disposed on the gate lift polysilicon 14. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010080756(A) 申请公布日期 2010.04.08
申请号 JP20080248721 申请日期 2008.09.26
申请人 ELPIDA MEMORY INC 发明人 IKEFUCHI YOSHINORI;OYU SHIZUNORI;TAKAISHI YOSHIHIRO
分类号 H01L29/78;H01L21/28;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L29/78
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