发明名称 DOPANT ACTIVATION ANNEAL TO ACHIEVE LESS DOPANT DIFFUSION (BETTER USJ PROFILE) AND HIGHER ACTIVATION PERCENTAGE
摘要 A method and apparatus for forming a semiconductor device. A semiconductor substrate is implanted with dopants. The substrate is subjected to a cleaning process employing electrically neutral nitrogen and fluorine radicals to produce an oxygen-free surface having dangling bonds. Before any further exposure to oxidizing gases, the substrate is annealed by thermal treatment to activate and distribute the dopants. A gate oxide layer is formed over the annealed surface. The apparatus performs all such treatments without breaking vacuum.
申请公布号 US2010087052(A1) 申请公布日期 2010.04.08
申请号 US20080247448 申请日期 2008.10.08
申请人 APPLIED MATERIALS, INC. 发明人 XU ZHI
分类号 H01L21/425;H01L21/00 主分类号 H01L21/425
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