发明名称 GALLIUM NITRIDE EPITAXIAL WAFER, AND METHOD OF MANUFACTURING EPITAXIAL WAFER
摘要 PURPOSE: A gallium nitride-based epitaxial wafer and a method for manufacturing an epitaxial wafer are provided to minimize the distribution of a light emission wavelength of an active layer by forming a well layer on a nitride-based substrate. CONSTITUTION: A gallium nitride-based substrate having a major face is prepared. A gallium nitride-based semiconductor film(43) is formed on the major face of the gallium nitride-based substrate. An active layer(45) is formed on a gallium nitride-based semiconductor film and has a quantum well structure(47). An active layer comprises a well layer(47a) consisting of the gallium-nitride group semiconductor including indium as III group element.
申请公布号 KR20100035591(A) 申请公布日期 2010.04.05
申请号 KR20090088507 申请日期 2009.09.18
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 YOSHIZUMI YUSUKE;UENO MASAKI;NAKAMURA TAKAO
分类号 H01L33/16;H01L33/02 主分类号 H01L33/16
代理机构 代理人
主权项
地址