发明名称 |
GALLIUM NITRIDE EPITAXIAL WAFER, AND METHOD OF MANUFACTURING EPITAXIAL WAFER |
摘要 |
PURPOSE: A gallium nitride-based epitaxial wafer and a method for manufacturing an epitaxial wafer are provided to minimize the distribution of a light emission wavelength of an active layer by forming a well layer on a nitride-based substrate. CONSTITUTION: A gallium nitride-based substrate having a major face is prepared. A gallium nitride-based semiconductor film(43) is formed on the major face of the gallium nitride-based substrate. An active layer(45) is formed on a gallium nitride-based semiconductor film and has a quantum well structure(47). An active layer comprises a well layer(47a) consisting of the gallium-nitride group semiconductor including indium as III group element.
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申请公布号 |
KR20100035591(A) |
申请公布日期 |
2010.04.05 |
申请号 |
KR20090088507 |
申请日期 |
2009.09.18 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
YOSHIZUMI YUSUKE;UENO MASAKI;NAKAMURA TAKAO |
分类号 |
H01L33/16;H01L33/02 |
主分类号 |
H01L33/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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