发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 According to an aspect of the present invention, there is provided a method of manufacturing a semiconductor device, the method including: forming a first film on a target film; forming resist patterns on the first film; processing the first film with the resist patterns to form first patterns including: periodic patterns; and aperiodic patterns; removing the resist patterns; forming a second film over the target film; processing the second film to form second side wall patterns on side walls of the first patterns; removing the periodic patterns; and processing the target film with the aperiodic patterns and the second side wall patterns, thereby forming target patterns including: periodic target patterns; aperiodic target patterns; and dummy patterns arranged between the periodic target patterns and the aperiodic patterns and arranged periodically with the periodic target patterns.
申请公布号 US2010081265(A1) 申请公布日期 2010.04.01
申请号 US20090557111 申请日期 2009.09.10
申请人 MASHITA HIROMITSU;KOTANI TOSHIYA;MUKAI HIDEFUMI;NAKAJIMA FUMIHARU;KODAMA CHIKAAKI 发明人 MASHITA HIROMITSU;KOTANI TOSHIYA;MUKAI HIDEFUMI;NAKAJIMA FUMIHARU;KODAMA CHIKAAKI
分类号 H01L21/28 主分类号 H01L21/28
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