DEVICE FOR MEASURING PHYSICAL PROPERTY OF PARTICLE

摘要

A device for measuring the physical property of particles ensures measurement accuracy with a structure of a single light detecting means and enables suppression of cost increase and reduction of places where adjustment is required by reducing the number of optical elements as possible.  The device for measuring the physical property of particles (1) includes, as an illumination optical system mechanism (2), a polarizer at a light incident-side (24) and a 1/4 wavelength plate at the light incident-side (25) and as a light receiving optical system mechanism (3), rotatable 1/4 wavelength plates at a light exit-side (33) and rotatable polarizers at the light exit-side (34) disposed at the different angles with respect to a cell (4) as the center.  A light attenuating means (23) for preventing the polarized state from being changed is provided on an optical path of the device, and a light attenuation rate is controlled by the light attenuating means (23) so that the intensity of light detected at each of measurement positions is within the measurement range of a light detecting means (31).