| 摘要 |
<p>The method involves detecting and storing offset values provided at an output of a signal converter (140), and contacting of inputs of the signal converters with electrical parameters e.g. voltage and current, in measuring channels (MK1-MK4). Measurement values provided at the output of the signal converters are detected. The measurement values are combined with the offset values based on a combination structure in hardware e.g. microcontroller, to obtain a corrected measurement value. The corrected measurement value is provided for transmission into a data processing unit. An independent claim is also included for a correction device for correcting offset errors of signal converters.</p> |
