发明名称 SAMPLE PREPARATION METHOD AND SAMPLE PREPARATION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a sample preparation method and a sample preparation device capable of discriminating clearly a boundary of a layer including an organic insulating film. Ž<P>SOLUTION: The method has a cross section exposing process for exposing a cross section of a sample by irradiating the sample Wa, formed by laminating the organic insulating film and another insulating film, with a focused ion beam 20A; and a cross section treating process for treating so that each film on the cross section can be discriminated by irradiating with the focused ion beam, while supplying water or steam to the cross section. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010066219(A) 申请公布日期 2010.03.25
申请号 JP20080235050 申请日期 2008.09.12
申请人 SEIKO I TECHNO RESEARCH CO LTD 发明人 TAKAHASHI KAZUKI
分类号 G01N1/28;H01L21/66 主分类号 G01N1/28
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