发明名称 METHOD FOR PRODUCING A THIN FILM TRANSISTOR AND METHOD FOR FORMING AN ELECTRODE
摘要 An electrode is prevented from being peeled from a substrate or a silicon layer. After the surface of a first copper thin film composed mainly of copper is treated by exposing it to an ammonia gas, a film of silicon nitride is formed on the surface of the first copper thin film by generating a plasma of a raw material gas containing a silane gas and an ammonia gas in an atmosphere in which an object to be processed is placed. Since the surface is preliminarily treated with the ammonia gas, the silane gas is prevented from being diffused into the first copper thin film. Therefore, an electrode constituted by the surface-treated first copper thin film is not peeled from the glass substrate or the silicon layer. In addition, its electric resistance value does not rise.
申请公布号 US2010075475(A1) 申请公布日期 2010.03.25
申请号 US20090630245 申请日期 2009.12.03
申请人 ULVAC, INC. 发明人 TAKASAWA SATORU;OISHI YUUICHI;SHIMIZU MIHO;KIKUCHI TOORU;ISHIBASHI SATORU
分类号 H01L21/336;H01L21/443 主分类号 H01L21/336
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