发明名称 CHEMICAL MECHANICAL POLISHING LIQUID AND CHEMICAL MECHANICAL POLISHING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing liquid enabling the coexistence of a high polishing speed and low erosion when polishing a body to be polished (a wafer), and a chemical mechanical polishing method using the chemical mechanical polishing liquid. <P>SOLUTION: The chemical mechanical polishing liquid includes glycine, triazoles, abrasive grains, an oxidant and a mixture of an alkyl diphenyl ether disulfonic acid and an alkyl diphenyl ether monosulfonic acid and/or a mixture of these salts. The chemical mechanical polishing method includes a process supplying a polishing pad on a polishing surface plate with the chemical mechanical polishing liquid, and a process polishing a surface to be polished containing the metal of a body to be polished by relatively moving the polishing pad and the surface to be polished while making the polishing pad contact with the surface to be polished by the rotation of the polishing surface plate. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010067914(A) 申请公布日期 2010.03.25
申请号 JP20080235191 申请日期 2008.09.12
申请人 FUJIFILM CORP 发明人 KIKUCHI MAKOTO;YAMADA TORU;INABA TADASHI
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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