发明名称 |
RAMAN SPECTROSCOPIC APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To obtain data of a structure or the like of a material by performing Raman spectral diffraction under various conditions by in-situ observation. Ž<P>SOLUTION: The sample chamber 12 of a Raman spectroscopic apparatus has a constitution wherein a sample holder 52 for housing a sample SL1 is arranged in a chamber body 41 and the sample SL1 is heated from its backside by a heating element 51. Further, a plurality of reflectors 61A-61E are arranged so as to surround the sample SL1 and holes 65A-65E are formed one by one on the side of the observation window 42 of the respective reflectors 61A-61E. The observation of the sample SL1 or the irradiation with exciting light is performed through those holes 65A-65E and the observation window 42 to execute Raman spectral diffraction. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
|
申请公布号 |
JP2010066080(A) |
申请公布日期 |
2010.03.25 |
申请号 |
JP20080231689 |
申请日期 |
2008.09.10 |
申请人 |
SEKI TECHNOTRON CORP;KYUSHU UNIV |
发明人 |
FUJINO SHIGERU;KUNIKAWA KOTARO;KAJIWARA TOSHINAO;SUNOSE MASANORI;FUJIWARA AKIRA;NEGISHI HIROSHI |
分类号 |
G01N21/65 |
主分类号 |
G01N21/65 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|