发明名称 RAMAN SPECTROSCOPIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To obtain data of a structure or the like of a material by performing Raman spectral diffraction under various conditions by in-situ observation. Ž<P>SOLUTION: The sample chamber 12 of a Raman spectroscopic apparatus has a constitution wherein a sample holder 52 for housing a sample SL1 is arranged in a chamber body 41 and the sample SL1 is heated from its backside by a heating element 51. Further, a plurality of reflectors 61A-61E are arranged so as to surround the sample SL1 and holes 65A-65E are formed one by one on the side of the observation window 42 of the respective reflectors 61A-61E. The observation of the sample SL1 or the irradiation with exciting light is performed through those holes 65A-65E and the observation window 42 to execute Raman spectral diffraction. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010066080(A) 申请公布日期 2010.03.25
申请号 JP20080231689 申请日期 2008.09.10
申请人 SEKI TECHNOTRON CORP;KYUSHU UNIV 发明人 FUJINO SHIGERU;KUNIKAWA KOTARO;KAJIWARA TOSHINAO;SUNOSE MASANORI;FUJIWARA AKIRA;NEGISHI HIROSHI
分类号 G01N21/65 主分类号 G01N21/65
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