发明名称 Semiconductor Device and Method of Forming Embedded Passive Circuit Elements Interconnected to Through Hole Vias
摘要 A semiconductor die has a first insulating material disposed around a periphery of the die. A portion of the first insulating material is removed to form a through hole via (THV). Conductive material is deposited in the THV. A second insulating layer is formed over an active surface of the die. A first passive circuit element is formed over the second insulating layer. A first passive via is formed over the THV. The first passive via is electrically connected to the conductive material in the THV. The first passive circuit element is electrically connected to the first passive via. A third insulating layer is formed over the first passive circuit element. A second passive circuit element is formed over the third insulating layer. A fourth insulating layer is formed over the second passive circuit element. A plurality of semiconductor die is stacked and electrically interconnected by the conductive via.
申请公布号 US2010072570(A1) 申请公布日期 2010.03.25
申请号 US20090627884 申请日期 2009.11.30
申请人 STATS CHIPPAC, LTD. 发明人 PAGAILA REZA A.;DO BYUNG TAI;LIN YAOJIAN
分类号 H01L23/48 主分类号 H01L23/48
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