发明名称 ILLUMINATION NON-UNIFORMITY QUANTIFICATION METHOD AND APPARATUS
摘要 <p>This disclosure relates to lithography using pulsed laser illumination. In particular it relates to lithography for producing electronic devices on wafers using multi-mode excimer and molecular lasers, e.g. KrF, ArF, and F2 lasers. It may also apply to illumination systems where several single-mode sources are mixed or one single-mode laser beam is split and recombined with time delays, thereby creating an equivalent multimode source and to EUV lithography. Particular aspects of the present invention are described in the claims, specification and drawings.</p>
申请公布号 KR20100031689(A) 申请公布日期 2010.03.24
申请号 KR20097026811 申请日期 2008.05.22
申请人 MICRONIC LASER SYSTEMS AB 发明人 SANDSTROEM TORBJOERN
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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