发明名称 DEVICE AND SYSTEM FOR INSPECTING FOREIGN MATTER
摘要 <P>PROBLEM TO BE SOLVED: To provide a foreign matter inspecting device capable of inspecting the presence of a foreign matter by preventing the overlooking of the foreign matter. Ž<P>SOLUTION: The foreign matter inspecting device 1 is constituted so as to acquire the image from the bottom surface side of a container B having permeability and filled with content to inspect the presence of the foreign matter in the container B on the basis of the acquired image and equipped with a conveyor 2 for holding the side surface of the container B to straightly feed the container B to an inspection position P, an upper illumination unit 3 for irradiating the container B with illumination light of an infrared region at the inspection position P from above, a lower light emitter 4 for throwing illumination light of a visible region on the bottom surface side of the container B at the inspection position P from the oblique downward direction of the outer periphery of the container B, a first camera 6A for taking the image formed by infrared rays, a second camera 6B for taking the image formed by visible light, and a cold mirror 7 for distributing the luminous flux emitted from the upper illumination unit 3 to the first camera 6A and distributing the luminous flux emitted from the lower light emitter 4 to the second camera 6B. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010060312(A) 申请公布日期 2010.03.18
申请号 JP20080223497 申请日期 2008.09.01
申请人 KIRIN TECHNO-SYSTEM CO LTD 发明人 MIZOGUCHI YORIYUKI;SHINDO YUKO;MAZAKI SHINYA
分类号 G01N21/90 主分类号 G01N21/90
代理机构 代理人
主权项
地址