| 摘要 |
A driver for supplying a test signal to a device under test is shared by a plurality of terminals. In this way, the cost and time required for the test of the device under test can be reduced. A testing apparatus 10 relating to the present invention includes a test signal generating section 130 that generates a test signal to be supplied to a device under test 20, a driver 140 that outputs the test signal, a switch 150 that is disposed on a wire between the driver 140 and a first terminal of the device under test 20, a switch 160 that is disposed on a wire between the driver 140 and a second terminal of the device under test 20, and a connection control section 100 that (i) turns on the switch 150 and turns off the switch 160 when the test signal is supplied to the first terminal of the device under test 20, and (ii) turns off the switch 150 and turns on the switch 160 when the test signal is supplied to the second terminal of the device under test 20.
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