发明名称 NON-VOLATILE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>PURPOSE: A non-volatile memory device and a method for fabricating the same are provided to prevent depletion layer from being formed in memory cell operation by reducing the impurity doping concentration of a floating gate. CONSTITUTION: A non-volatile memory device comprises a cell region and a peripheral circuit region. A floating gate electrode of a cell region has an impurity doping concentration lower than the floating gate electrode of a peripheral circuit region. An inversion layer is formed in the interface of the tunnel insulation film(310) and floating gate electrode(320).</p>
申请公布号 KR20100028825(A) 申请公布日期 2010.03.15
申请号 KR20080087740 申请日期 2008.09.05
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, HEUNG JAE;JOO, MOON SIG;KU, JA CHUN;KIM, YONG SOO;CHOI, WON JOON
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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