发明名称 |
APPARATUS AND METHOD FOR MEASURING SIMILARITY BETWEEN ONTOLOGIES |
摘要 |
PURPOSE: An apparatus and a method for measuring similarity between ontologies are provided to accurately measure similarity between ontologies in consideration of a concept included in ontologies and the structure of ontologies. CONSTITUTION: A path pair extracting unit(154) measures concept similarity to paths extracted from ontologies corresponding to paths extracted from an ontology. The path pair extracting unit extracts a path pair. A path pair similarity measuring unit(156) assigns a similarity weight value to the extracted path pair. The path pair similarity measuring unit measures the path pair similarity. A structure similarity measuring unit(158) measures structure similarity between ontologies using a sum value of the path pair similarity of the path pairs.
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申请公布号 |
KR100947578(B1) |
申请公布日期 |
2010.03.15 |
申请号 |
KR20090098122 |
申请日期 |
2009.10.15 |
申请人 |
DONGGUK UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION |
发明人 |
LEE, YONG KYU;PARK, MEE HWA |
分类号 |
G06F17/00;G06F17/30 |
主分类号 |
G06F17/00 |
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