发明名称 APPARATUS AND METHOD FOR MEASURING SIMILARITY BETWEEN ONTOLOGIES
摘要 PURPOSE: An apparatus and a method for measuring similarity between ontologies are provided to accurately measure similarity between ontologies in consideration of a concept included in ontologies and the structure of ontologies. CONSTITUTION: A path pair extracting unit(154) measures concept similarity to paths extracted from ontologies corresponding to paths extracted from an ontology. The path pair extracting unit extracts a path pair. A path pair similarity measuring unit(156) assigns a similarity weight value to the extracted path pair. The path pair similarity measuring unit measures the path pair similarity. A structure similarity measuring unit(158) measures structure similarity between ontologies using a sum value of the path pair similarity of the path pairs.
申请公布号 KR100947578(B1) 申请公布日期 2010.03.15
申请号 KR20090098122 申请日期 2009.10.15
申请人 DONGGUK UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION 发明人 LEE, YONG KYU;PARK, MEE HWA
分类号 G06F17/00;G06F17/30 主分类号 G06F17/00
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