发明名称 STRUCTURAL ANALYSIS APPARATUS AND STRUCTURAL ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a structural analysis apparatus for easily enhancing consistency with an experimental result. SOLUTION: The structural analysis apparatus has an observation device for observing the position of an observation mark which is fixed to an observation object, and a processor for receiving the observation result of the observation device. The processor executes the processes of: virtually dividing the observation object into a plurality of elements and setting a plurality of nodes on the elements; selecting a node corresponding to the position of the observation mark or one node on an element including the position of the observation mark as a specific node; measuring displacement of the observation mark on the basis of the observation result acquired from the observation device; determining the displacement of the specific node corresponding to the observation mark on the basis of the measured displacement of the observation mark; and performing structural analysis of the observation object with the determined displacement of the specific node as a constraint. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010055517(A) 申请公布日期 2010.03.11
申请号 JP20080222027 申请日期 2008.08.29
申请人 SUMITOMO HEAVY IND LTD 发明人 MORITA HIROSHI
分类号 G06F17/50 主分类号 G06F17/50
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