发明名称 APPARATUS AND METHOD FOR PROCESSING SEMICONDUCTOR
摘要 PROBLEM TO BE SOLVED: To achieve ashing in a resist even when ion implantation of any density is applied to the resist. SOLUTION: A wafer coated with a resist is irradiated with ultraviolet light in a chamber 7. The wafer is brought into contact with ozone gas in a chamber 5 to ash the wafer. The wafer is brought into contact with semiconductor gas corresponding to a resist component in a chamber 6. The wafer irradiated with the ultraviolet light is brought into contact with ozone gas in the chamber 7. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010056332(A) 申请公布日期 2010.03.11
申请号 JP20080220294 申请日期 2008.08.28
申请人 IWATANI INTERNATL CORP;NANO MATERIAL KENKYUSHO:KK 发明人 KOIKE KUNIHIKO;SHIOTANI YOSHIMI
分类号 H01L21/3065;H01L21/027 主分类号 H01L21/3065
代理机构 代理人
主权项
地址