发明名称 |
APPARATUS AND METHOD FOR PROCESSING SEMICONDUCTOR |
摘要 |
PROBLEM TO BE SOLVED: To achieve ashing in a resist even when ion implantation of any density is applied to the resist. SOLUTION: A wafer coated with a resist is irradiated with ultraviolet light in a chamber 7. The wafer is brought into contact with ozone gas in a chamber 5 to ash the wafer. The wafer is brought into contact with semiconductor gas corresponding to a resist component in a chamber 6. The wafer irradiated with the ultraviolet light is brought into contact with ozone gas in the chamber 7. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010056332(A) |
申请公布日期 |
2010.03.11 |
申请号 |
JP20080220294 |
申请日期 |
2008.08.28 |
申请人 |
IWATANI INTERNATL CORP;NANO MATERIAL KENKYUSHO:KK |
发明人 |
KOIKE KUNIHIKO;SHIOTANI YOSHIMI |
分类号 |
H01L21/3065;H01L21/027 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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