发明名称 System and Method for on-machine 3-D depth measurement
摘要 The present invention provides a method and system for on-machine 3-D depth measurement. The same image retrieving apparatus measures the first distance for the width of the similar gray-level region of cutting-surface from the first angle, and measures the second distance for the width of the similar gray-level region of cutting-surface from the first angle superimposing the second angle. The width of the similar gray-level region of cutting-surface comprises the cutting-surface and the shadow of the bottom portion of the cutting-surface. And then the cutting-surface depth is calculated according to the first angle, the second angle, the first distance, and the second distance.
申请公布号 US2010060907(A1) 申请公布日期 2010.03.11
申请号 US20080204984 申请日期 2008.09.05
申请人 CHUNG YUAN CHRISTIAN UNIVERSITY 发明人 WANG SHIH-MING;YU HAN-JEN
分类号 G01B11/22 主分类号 G01B11/22
代理机构 代理人
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