METHOD FOR QUANTITATIVELY MAKING A THICKNESS ESTIMATE OF THIN GEOLOGICAL LAYERS BASED ON SEISMIC REFLECTION SIGNALS IN THE FREQUENCY DOMAIN

摘要

The invention is a method of estimating thickness of a geological layer (L), the method comprising the steps of: (a) selecting seismic reflection field data from a subsurface depth interval of interest; (b) providing a plurality of geological models having different layer thicknesses and providing respective model responses from the plurality of geological models; (c) comparing a frequency spectrum of the seismic reflection field data with each of the frequency spectra of the model responses to derive comparison data associated with the different layer thicknesses of the models; and (d) deriving from the comparison data a model layer thickness that is indicative of the thickness of the geological layer.