发明名称 ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide an automatic analyzer for extracting easily a measured result obtained using a consumable with a defect-generated production lot number, out of the consumables used in the analyzer, and for preventing the consumable having the defect lot number from being used for analysis hereafter. Ž<P>SOLUTION: In this analyzer, consumable information containing the defect lot number is got through a communication means to be stored in the analyzer. The stored defect information is collated with the consumable information used in the analysis when obtaining the each measured result, or the consumable information set in the analyzer. The analyzer extracts and displays the measured result obtained using the consumable with the defect lot number, or discriminates the consumable with the defect lot number, as a result of the collation. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010054517(A) 申请公布日期 2010.03.11
申请号 JP20090278111 申请日期 2009.12.08
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 IIJIMA MASAHIKO;NISHIDA MASAHARU
分类号 G01N35/00 主分类号 G01N35/00
代理机构 代理人
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