发明名称 |
SAMPLE ANALYZING METHOD, SAMPLE CARRY-IN MEMBER, SAMPLE CARRY-IN METHOD AND THERMAL DESORPTION SPECTROMETER |
摘要 |
PROBLEM TO BE SOLVED: To increase the analytical sensitivity of an infinitesimal component in a sample. SOLUTION: The sample analyzing method includes: a sample preparation step of preparing a sample (14) in a liquid; a sample cooling and taking-in step of taking-in the prepared sample (14) into a liquid refrigerant contained in a refrigerant storing part (21b) of a sample carry-in member (21)in a sunken condition: a sample carry-in step of carrying the sample carry-in member (21) containing the sample (14) to a carry-in chamber (12) connected to an analytical vacuum chamber (2) where the analysis is performed evacuated under vacuum; a carry-in chamber evacuating step of evacuating the carry-in chamber (12) to vacuum; a sample moving step of moving the sample carry-in member (21) of the carry-in chamber (12) to the analytical vacuum room (2) and moving the sample (14) of the sample carry-in member (14) to a sample holding member (3) of the analytical vacuum chamber (2); and a sample analyzing step of analyzing the sample of the sample holding member (3). COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010054498(A) |
申请公布日期 |
2010.03.11 |
申请号 |
JP20090162087 |
申请日期 |
2009.07.08 |
申请人 |
DENSHI KAGAKU KK |
发明人 |
MAEJIMA KUNIMITSU;TAKAI KENICHI;HIRASHITA NORIO |
分类号 |
G01N1/00 |
主分类号 |
G01N1/00 |
代理机构 |
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