发明名称 HEAT TREATMENT APPARATUS, HEAT TREATMENT METHOD AND STORAGE MEDIUM
摘要 PURPOSE: A heat treatment apparatus, a heat treatment method and a storage medium are provided to simultaneously perform heat treatment to a plurality of wafers by loading the wafers on a wafer boat of a rack shape and transferring the wafers to a heat treatment furnace. CONSTITUTION: A normal height position of a ring unit(38) is obtained by relatively elevating and lowering a transfer base unit(5) with respect to a wafer boat(3) when the wafer boat is not subjected to a heat treatment. A height position of the corresponding ring unit is obtained before a wafer(W), which is not heat-treatmented, is transferred to the wafer boat. Whether to transfer the wafer to the wafer boat can be verified by comparing a difference between the normal height position of the ring unit and the height position the ring unit before the wafer is transferred.
申请公布号 KR20100027037(A) 申请公布日期 2010.03.10
申请号 KR20090080139 申请日期 2009.08.28
申请人 TOKYO ELECTRON LIMITED 发明人 ABE YO;TAKAHASHI KIICHI;SATO JUNYA;MOTODATE YOSHINOBU
分类号 H01L21/324 主分类号 H01L21/324
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