发明名称 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, AND POLYMERIC COMPOUND
摘要 PURPOSE: A positive resist composition, a method of making resist pattern, and a new high molecular compound used in the positive resist composition are provided to improve a state changing property and to prevent a perfect circle of a hole from degrading. CONSTITUTION: A positive resist composition consists of a substrate component in which the solubility of an alkaline developing solution is enlarged with a reaction to acid, and a photoacid generator component which generates acid with an exposure. The substrate component contains a high molecular compound with a component induced from esther acrylate including an acid beaver dissolution inhibitor or a component shown in chemical formula 1. In chemical formula 1, R1 refers to a hydrogen atom, a low alkyl group, or a halogenation low alkyl group. R2 refers to a divalent coupling element. R3 refers to a ring shaped group, including -SO_2- in a ring structure.
申请公布号 KR20100023748(A) 申请公布日期 2010.03.04
申请号 KR20090076550 申请日期 2009.08.19
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 DAZAI TAKAHIRO;HIRANO TOMOYUKI;SHIONO DAIJU;MATSUMIYA TASUKU
分类号 G03F7/039;G03F7/027 主分类号 G03F7/039
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