发明名称 HIGH VOLTAGE DEVICE WITH REDUCED LEAKAGE
摘要 A semiconductor device is provided which includes a semiconductor substrate, a gate structure formed on the substrate, sidewall spacers formed on each side of the gate structure, a source and a drain formed in the substrate on either side of the gate structure, the source and drain having a first type of conductivity, a lightly doped region formed in the substrate and aligned with a side of the gate structure, the lightly doped region having the first type of conductivity, and a barrier region formed in the substrate and adjacent the drain. The barrier region is formed by doping a dopant of a second type of conductivity different from the first type of conductivity.
申请公布号 US2010052057(A1) 申请公布日期 2010.03.04
申请号 US20090549540 申请日期 2009.08.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHUNG SHU-WEI VANESSA;YU KUO-FENG
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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