发明名称 POSITIVE RESIST COMPOSITION AND METHOD OF FORMING RESIST PATTERN
摘要 A positive resist composition including: a base component (A) which exhibits increased solubility in an alkali developing solution under the action of acid; and an acid-generator component (B) which generates acid upon exposure; dissolved in an organic solvent (S), the organic solvent (S) including an alcohol-based organic solvent having a boiling point of at least 150° C.; and a method of forming a resist pattern including: applying the positive resist composition on a substrate on which a first resist pattern is formed to form a second resist film; and subjecting the second resist film to selective exposure and alkali developing to form a resist pattern.
申请公布号 US2010047724(A1) 申请公布日期 2010.02.25
申请号 US20090534735 申请日期 2009.08.03
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 TAKESHITA MASARU;KUMADA SHINJI;YOSHII YASUHIRO;IWAI TAKESHI;NAKAMURA TSUYOSHI
分类号 G03C1/053;G03C1/00;G03F7/00 主分类号 G03C1/053
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