发明名称 Magnetic field characterization of stresses and properties in materials
摘要 Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
申请公布号 US2010045277(A1) 申请公布日期 2010.02.25
申请号 US20080080743 申请日期 2008.04.04
申请人 JENTEK SENSORS, INC. 发明人 GOLDFINE NEIL J.;SHAY IAN C.;SCHLICKER DARRELL E.;WASHABAUGH ANDREW P.;GRUNDY DAVID C.;LYONS ROBERT J.;ZILBERSTEIN VLADIMIR A.;TSUKERNIK VLADIMIR
分类号 G01R33/18;G01N27/90 主分类号 G01R33/18
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