发明名称 Stain inspection method and apparatus
摘要 (A) Luminance data is prepared. (B) A group of first order differential values is obtained from luminance values of said luminance data along a first direction, a group of second order differential values is obtained from the group of first order differential values, and first data is output in accordance with the group of second order differential values. There is provided a stain inspection method having high inspection correctness.
申请公布号 US7668344(B2) 申请公布日期 2010.02.23
申请号 US20060349962 申请日期 2006.02.09
申请人 FUJIFILM CORPORATION 发明人 MATSUMOTO ICHIRO;NISHIKAWA TETSUO
分类号 G06K9/00;G01N21/00 主分类号 G06K9/00
代理机构 代理人
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