发明名称 Trench gate type semiconductor device
摘要 A semiconductor device includes: a first semiconductor layer; a second semiconductor layer on the first semiconductor layer; a third semiconductor layer on the second semiconductor layer; a fourth semiconductor layer in a part of the third semiconductor layer; a trench penetrating the fourth semiconductor layer and the third semiconductor layer and reaching the second semiconductor layer; a gate insulation film on an inner wall of the trench; a gate electrode on the gate insulation film in the trench; a first electrode; and a second electrode. The trench includes a bottom with a curved surface having a curvature radius equal to or smaller than 0.5 μm.
申请公布号 US7667269(B2) 申请公布日期 2010.02.23
申请号 US20060398551 申请日期 2006.04.06
申请人 DENSO CORPORATION 发明人 TSUZUKI YUKIO;TOKURA NORIHITO;OZEKI YOSHIHIKO;YAMAMOTO KENSAKU
分类号 H01L23/62 主分类号 H01L23/62
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