| 摘要 |
PURPOSE: A probe structure is provided to repair of a probe structure by replacing a probe including a contact member selectively and reducing the repair costs for the probe structure. CONSTITUTION: A probe structure(100) comprises two probes(110) and insulating members. Two probes are comprised of a conductive body, a plurality of contact member, and an input terminal. A plurality of contacts are electrically connected with each other and are contacted to the flat panel display. The input terminal inputs the signal for a test of the flat panel display. The Insulating members are included between probes by insulating the probes. A fixing member(130) holds the probes and the laminated insulating members. |
