发明名称 CONFOCAL MICROSCOPE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a confocal microscope system which provides a high quality image by removing both of noise such as smearing noise due to an optical image incidence to an imaging apparatus during the term other than an exposure term and banding noise. SOLUTION: An exposure operation of the imaging apparatus 11 and the quantity of light made incident to the imaging apparatus 11 are synchronously controlled with the scanning period of an optical scanning means having a mask pattern member 5 as a reference, so that the exposure time is made to be a multiple of integer of the minimum time necessary for scanning a specimen, and consequently the optical image incidence to the imaging apparatus during the term other than the exposure term is suppressed. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010039438(A) 申请公布日期 2010.02.18
申请号 JP20080205718 申请日期 2008.08.08
申请人 YOKOGAWA ELECTRIC CORP 发明人 HIGASHI TAKUYA;HIRUKAWA HIDEO
分类号 G02B21/06;G02B21/36;G02B26/10;G02F1/11 主分类号 G02B21/06
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