| 摘要 |
<P>PROBLEM TO BE SOLVED: To materialize an IC tester easily masking a window hold section. Ž<P>SOLUTION: This IC tester is obtained by improving on an IC tester for testing a testing object by means of window comparison. This device is provided with two comparators and two logical multiplication circuits. The two comparators are for comparing an output from the testing object with a high-level comparison voltage or with a low-level comparison voltage. The logical multiplication circuits are provided for outputs of these comparators, respectively, to execute logical multiplication by thereinto inputting the output, strobe signals for determining a window section, and a mask signal for masking the window section. Outputs of the multiplication circuits are held to make a determination on the testing object based on the held result. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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