发明名称 CALCULATION METHOD FOR INTERCONNECT CAPACITANCE, AND DESIGN SUPPORT DEVICE FOR WIRING PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a calculation method of interconnect capacitance by which the interconnect capacitance of a wiring pattern including oblique wiring, whose layout has been prepared, is correctly obtained at high speed, and to provide a design support device of the wiring pattern. Ž<P>SOLUTION: The calculation method of the interconnect capacitance includes: a first step of dividing a circuit region including the wiring region of a wiring pattern designed to include oblique wiring into a plurality of unit regions by prescribed grids; a second step of considering each unit region is either a wiring existence region or a wiring non-existence region according to the coverage of the wiring pattern in each unit region, and converting the oblique wiring section into a pseudo-wiring pattern including only basic cells having the shape of the unit region; a third step of carrying out pattern matching with a capacity table configured by associating the basic wiring pattern with the capacity about the obtained pseudo wiring pattern; and a fourth step of calculating an interconnect capacitance about the pseudo-wiring pattern based on the result of pattern matching. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010039521(A) 申请公布日期 2010.02.18
申请号 JP20080198176 申请日期 2008.07.31
申请人 SONY CORP 发明人 TSURUMA TAKEYUKI;WATANABE MAKOTO
分类号 G06F17/50;H01L21/82 主分类号 G06F17/50
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