发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND DEVICE FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To maintain the quality of plating processing by computing concentrations of components contained in a plating liquid and suitably adjusting the plating liquid. SOLUTION: A method for manufacturing a semiconductor device includes: a step of adding one or a plurality of additives to the plating liquid and performing plating processing on a semiconductor wafer (step S1); a step of measuring one or a plurality of parameters showing the processing state of the plating processing (step S3); a step of computing the concentrations of components contained in the plating liquid from the parameters (step S4); and a step of performing adjustment processing on the plating liquid, so that the computed concentrations of the components are equal to or less than predetermined thresholds (step S6). COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010040667(A) 申请公布日期 2010.02.18
申请号 JP20080199977 申请日期 2008.08.01
申请人 NEC ELECTRONICS CORP 发明人 FURUYA AKIRA
分类号 H01L21/288;C25D7/12;C25D21/14 主分类号 H01L21/288
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