发明名称 X-RAY FOREIGN MATTER INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray foreign matter inspecting device for forcibly preventing toppling of an inspection object. SOLUTION: The X-ray foreign matter inspecting device 100 includes an inspection chamber 1, having a carry-in port 8 and a carry-out port 9 for an inspecting object S, an X-ray irradiator 2 for having X-rays irradiated into the inspection chamber 1 to form an X-ray irradiation region R; an X-ray detector 3 that is arranged facing the X-ray irradiator 2 so as to grip the inspection chamber 1 and detects the X-rays; a conveying means 4 for conveying the inspecting object S from the carrying in port 8 to the carrying out port 9 so as to cross the X-ray irradiation region R; an X-ray leakage preventing curtain 5, that is formed of a plurality of strip-of-paper members 12 and disposed on the sides of the carrying in port 8 and the carry-out port 9 of the X-ray irradiation region R; and a guide member 6, that is arranged above a conveying road of the inspecting object S, passes between the strip-of-paper members 12 and which extends in the conveying direction of the inspecting object S. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010032462(A) 申请公布日期 2010.02.12
申请号 JP20080197411 申请日期 2008.07.31
申请人 YAMATO SCALE CO LTD 发明人 TODA TATSUMI;MORIYAMA YOSHINORI
分类号 G01N23/04 主分类号 G01N23/04
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