发明名称 BURIED FLOATING LAYER STRUCTURE FOR IMPROVED BREAKDOWN
摘要 A buried layer architecture which includes a floating buried layer structure adjacent to a high voltage buried layer connected to a deep well of the same conductivity type for components in an IC is disclosed. The floating buried layer structure surrounds the high voltage buried layer and extends a depletion region of the buried layer to reduce a peak electric field at lateral edges of the buried layer. When the size and spacing of the floating buried layer structure are optimized, the well connected to the buried layer may be biased to 100 volts without breakdown. Adding a second floating buried layer structure surrounding the first floating buried layer structure allows operation of the buried layer up to 140 volts. The buried layer architecture with the floating buried layer structure may be incorporated into a DEPMOS transistor, an LDMOS transistor, a buried collector npn bipolar transistor and an isolated CMOS circuit.
申请公布号 US2010032756(A1) 申请公布日期 2010.02.11
申请号 US20090537326 申请日期 2009.08.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 PENDHARKAR SAMEER P.;HU BINGHUA;CHEN XINFEN
分类号 H01L29/06;H01L21/761;H01L27/092;H01L29/73;H01L29/78 主分类号 H01L29/06
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