CIRCUIT WITH TESTABLE CIRCUIT COUPLED TO PRIVILEGED INFORMATION SUPPLY CIRCUIT
摘要
<p>A circuit is operable in a normal operating mode and a test mode. The circuit contains a privileged information supply circuit (12) coupled to the testable circuit (10). A test access circuit (19) provides access to the testable circuit (10). A test control circuit (18) controls switching of the test access circuit (19) to the test mode. A multiplex circuit (16) couples the privileged information supply circuit (12) to the testable circuit (10) for access to privileged information in the normal mode. In the test mode the shadow information supply circuit (14) is coupled to the testable circuit (10) instead.</p>
申请公布号
WO2010016004(A1)
申请公布日期
2010.02.11
申请号
WO2009IB53388
申请日期
2009.08.04
申请人
NXP B.V.;VERMEULEN, HUBERTUS GERARDUS HENDRIKUS;NIEUWLAND, ANDRE KRIJN
发明人
VERMEULEN, HUBERTUS GERARDUS HENDRIKUS;NIEUWLAND, ANDRE KRIJN