发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD USING THE SAME
摘要 A semiconductor integrated circuit includes a pulse control register configured to hold an assigned code with a smaller number of bits than that of a pulse control pattern used to control an oscillation output of an oscillator, a code conversion unit configured to convert the assigned code held by the pulse control register into the pulse control pattern, and a pulse control unit configured to generate the test pulses by controlling pulses of the oscillation output of the oscillator based on the pulse control pattern resulting from the conversion by the code conversion unit.
申请公布号 US2010033189(A1) 申请公布日期 2010.02.11
申请号 US20090535130 申请日期 2009.08.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MATSUMOTO TAKASHI
分类号 G01R31/02;H03K3/00 主分类号 G01R31/02
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