发明名称 SEMICONDUCTOR VERIFYING DEVICE, METHOD, AND PROGRAM
摘要 <p>A memory storing the control sequence of a clock cycle for each semiconductor device is prepared. The control sequence is calculated in advance according to a program or the like on a computer and written in the memory. When the corresponding semiconductor device is controlled, the contents of the memory are given to the semiconductor device.</p>
申请公布号 WO2010016300(A1) 申请公布日期 2010.02.11
申请号 WO2009JP57862 申请日期 2009.04.20
申请人 NEC CORPORATION;HOSOKAWA, KOHEI 发明人 HOSOKAWA, KOHEI
分类号 G06F17/50;H03K19/00 主分类号 G06F17/50
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