发明名称 INTERLAYER INSULATING FILM, WIRING STRUCTURE AND ELECTRONIC DEVICE AND METHODS OF MANUFACTURING THE SAME
摘要 A wiring structure of a semiconductor device or the like includes an interlayer insulating film having a fluorocarbon film formed on an underlayer, and a conductor buried in the interlayer insulating film. The fluorocarbon film contains nitrogen and is low in dielectric constant, excellent in reproducibility and stable.
申请公布号 US2010032844(A1) 申请公布日期 2010.02.11
申请号 US20070514173 申请日期 2007.11.08
申请人 NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY;TOKYO ELECTRON LIMITED 发明人 OHMI TADAHIRO;YASUDA SEIJI;INOKUCHI ATSUTOSHI;MATSUOKA TAKAAKI;KAWAMURA KOHEI
分类号 H01L23/48 主分类号 H01L23/48
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