发明名称 SCHOTTKY BARRIER DIODE AND METHOD FOR MANUFACTURING SCHOTTKY BARRIER DIODE
摘要 <p>Disclosed is a method for manufacturing a schottky barrier diode (11), comprising the following steps.  A GaN substrate (2) is first provided.  A GaN layer (3) is formed on the GaN substrate (2).  A schottky electrode (4) is formed that includes a first layer which is formed of Ni or a Ni alloy and formed in contact with the top of the GaN layer (3).  The step of forming the schottky electrode (4) comprises the step of forming a metal layer to serve as the schottky electrode (4) and the step of heat treating the metal layer.  The dislocation density of a region, in the GaN layer (3), which is in contact with the schottky electrode (4) is not more than 1 × 108 cm-2.</p>
申请公布号 WO2010016388(A1) 申请公布日期 2010.02.11
申请号 WO2009JP63149 申请日期 2009.07.23
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;HORII, TAKU;MIYAZAKI, TOMIHITO;KIYAMA, MAKOTO 发明人 HORII, TAKU;MIYAZAKI, TOMIHITO;KIYAMA, MAKOTO
分类号 H01L29/47;H01L21/28;H01L29/872 主分类号 H01L29/47
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