发明名称 |
SCHOTTKY BARRIER DIODE AND METHOD FOR MANUFACTURING SCHOTTKY BARRIER DIODE |
摘要 |
<p>Disclosed is a method for manufacturing a schottky barrier diode (11), comprising the following steps. A GaN substrate (2) is first provided. A GaN layer (3) is formed on the GaN substrate (2). A schottky electrode (4) is formed that includes a first layer which is formed of Ni or a Ni alloy and formed in contact with the top of the GaN layer (3). The step of forming the schottky electrode (4) comprises the step of forming a metal layer to serve as the schottky electrode (4) and the step of heat treating the metal layer. The dislocation density of a region, in the GaN layer (3), which is in contact with the schottky electrode (4) is not more than 1 × 108 cm-2.</p> |
申请公布号 |
WO2010016388(A1) |
申请公布日期 |
2010.02.11 |
申请号 |
WO2009JP63149 |
申请日期 |
2009.07.23 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;HORII, TAKU;MIYAZAKI, TOMIHITO;KIYAMA, MAKOTO |
发明人 |
HORII, TAKU;MIYAZAKI, TOMIHITO;KIYAMA, MAKOTO |
分类号 |
H01L29/47;H01L21/28;H01L29/872 |
主分类号 |
H01L29/47 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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