发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 In a semiconductor memory device, a voltage rise due to IR-DROP is suppressed which occurs when a ground voltage is applied to a memory cell during a program operation. Discharge transistors are provided between the ground and bit lines connected to the source and drain of the memory cell. The discharge transistors receive mutually independent discharge control signals which are generated and outputted from a DS decoder driver at the respective gates thereof. To the bit line which applies the ground voltage to the memory cell, the ground voltage can be set using the discharge transistor.
申请公布号 US2010027366(A1) 申请公布日期 2010.02.04
申请号 US20090488867 申请日期 2009.06.22
申请人 KOUNO KAZUYUKI;HARUYAMA HOSHIHIDE;NAKAYAMA MASAYOSHI;MOCHIDA REIJI 发明人 KOUNO KAZUYUKI;HARUYAMA HOSHIHIDE;NAKAYAMA MASAYOSHI;MOCHIDA REIJI
分类号 G11C5/14 主分类号 G11C5/14
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