发明名称 |
Signal Quality Monitoring to Defeat Microchip Exploitation |
摘要 |
Method and apparatus and associated method of detecting microchip tampering may include a conductive element in electrical communication with multiple sensors for verifying that signal degradation occurs at an expected region of the conductive element. A detected variance from the expected region may automatically trigger an action for impeding an integrated circuit exploitation process.
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申请公布号 |
US2010031375(A1) |
申请公布日期 |
2010.02.04 |
申请号 |
US20080181352 |
申请日期 |
2008.07.29 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BARTLEY GERALD K.;BECKER DARRYL J.;DAHLEN PAUL E.;GERMANN PHILIP R.;MAKI ANDREW B.;MAXSON MARK O. |
分类号 |
G06F21/02 |
主分类号 |
G06F21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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