发明名称 Signal Quality Monitoring to Defeat Microchip Exploitation
摘要 Method and apparatus and associated method of detecting microchip tampering may include a conductive element in electrical communication with multiple sensors for verifying that signal degradation occurs at an expected region of the conductive element. A detected variance from the expected region may automatically trigger an action for impeding an integrated circuit exploitation process.
申请公布号 US2010031375(A1) 申请公布日期 2010.02.04
申请号 US20080181352 申请日期 2008.07.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BARTLEY GERALD K.;BECKER DARRYL J.;DAHLEN PAUL E.;GERMANN PHILIP R.;MAKI ANDREW B.;MAXSON MARK O.
分类号 G06F21/02 主分类号 G06F21/02
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