| 摘要 |
A SEMI-AUTOMATIC MULTIPLEXING SYSTEM FOR AUTOMATED SEMICONDUCTOR WAFER TESTING EMPLOYS A JUMPER BLOCK (22) FOR EACH DEVICE TYPE IN THE SEMICONDUCTOR WAFER TO BE TESTED, EACH JUMPER BLOCK HAVING INPUTS FOR RECEIVING A TEST INPUT/OUTPUT LINE, A PLURALITY OF BLOCK CONTACTS CORRESPONDING TO PADS FOR A DEVICE TO BE TESTED, AND MANUALLY SET CONNECTORS (23) OR JUMPER CABLES FOR SELECTIVELY INTERCONNECTING JUMPER BLOCK INPUTS TO BLOCK CONTACTS. A MULTIPLEXER (30) IS THEN USED FOR SELECTIVELY CONNECTING TESTER INPUT/OUTPUT LINES TO THE JUMPER BLOCKS, THEREBY REDUCING THE NUMBER OF RELAYS REQUIRED FOR CONNECTING TEST SIGNALS TO THE DEVICES IN THE SEMICONDUCTOR WAFER.
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