| 摘要 |
The invention relates to an analytical system and to a method performed therewith for generating and metering optical signals and/or the variations thereof from metering ranges, which are arranged in a one-dimensional or two-dimensional array on a substantially optically transparent sensor platform (2), at least comprising an optical system comprising an illuminating system (1) for illuminating metering ranges on the sensor platform (2) and a detection system (3) comprising at least one detection unit (11) for detecting signals from the metering ranges on the sensor platform (11) the direction of the transmission or reflection of the illuminating light in a spectral range, which comprises the spectral range of the illuminating light, and a sensor platform (2), which can be inserted into the optical system, comprising metering ranges, which are arranged thereon in a one-dimensional or a two-dimensional array, characterized in that the illuminating system (1) comprises an arrangement (8.4) identified as "SLM" for the temporally rapidly variable spatial light modulation, by means of which in the operating state, illuminating patterns of a freely selectable and rapidly variable geometry, which can be determined by the settings of the SLM (8.4), can be generated on the sensor platform (2) from an illuminating light (4), which enters into this SLM (8.4) and which comprises a substantially homogenous intensity distribution in the cross section of the illuminating light at right angle to its direction of expansion. The invention also relates to the use of the analytical system according to the invention and to the methods according to the invention carried out therewith.
|
