发明名称 |
EXPOSURE APPARATUS, COATINGS FOR EXPOSURE APPARATUS, LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, AND DEVICE MANUFACTURED THEREBY |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus for reducing or eliminating adhesion of contaminant for various components of the exposure apparatus. <P>SOLUTION: The exposure apparatus includes a radiation system configured for supplying radiation beam, a patterning apparatus for patterning the radiation beam according to a required pattern, a substrate table for supporting a substrate, and a projection system for projecting a patterned radiation beam to the target on the substrate. At least a portion of the substrate table is covered with a coating. The coating includes a metal oxide, a photocatalyst, or a semiconductor material, or the combination thereof. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010016389(A) |
申请公布日期 |
2010.01.21 |
申请号 |
JP20090188713 |
申请日期 |
2009.08.17 |
申请人 |
ASML NETHERLANDS BV |
发明人 |
BOOGAARD ARJEN;SENGERS TIMOTHEUS FRANCISCUS;MARIA KETELAARS WILHELMUS SEBASTIANUS MARCUS;SPEE CAROLUS IDA MARIA ANTONIUS |
分类号 |
H01L21/027;G03F7/20;H01L21/683 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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