| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To improve measuring accuracy of an irradiation field position when measuring the irradiation field position by the measurement with prompt gamma radiation by irradiating an irradiation object with an ion beam. <P>SOLUTION: The charged particle beam irradiation system includes a charged particle beam generating device generating a charged particle beam, an irradiating device emitting the charged particle beam to the irradiation object, a Compton camera detecting the prompt gamma radiation generated from the irradiation object based on the charged particle beam and outputting gamma radiation detecting signals, an absorber arranged between the irradiation object and the Compton camera and absorbing the prompt gamma radiation with energy less than 1 MeV, and an irradiation field confirming device obtaining the irradiation field by the gamma radiation detecting signals from the Compton camera; thereby the position measuring accuracy of the irradiation field can be enhanced. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
