| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a capacitor circuit equipped with a test circuit that can reduce a test time without capacitance test, when an abnormal connection is found, a variable capacitance circuit which uses the capacitor circuit, a resonance circuit which uses the variable capacitance circuit, and a testing method for the capacitor circuit. Ž<P>SOLUTION: If a test signal TEST goes into high level, an NMOS transistor M2 is turned off, as well as, PMOS transistors M1 and M3 are turned on, respectively; the drain of an NMOS transistor MC is connected to a power supply voltage Vdd via the PMOS transistor M1 and an ammeter 3; the gate voltage of the NMOS transistor MC rises up to the power supply voltage Vdd and causes the NMOS transistor MC to go into an ON state; and a current i1 flows through a path formed by the power supply voltage Vdd to the ammeter 3, to a connection terminal T1, to the PMOS transistor M1, to the NMOS transistor MC, and then to a ground voltage GND, in this order. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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